Wafer Inspection Device
Please make use of this for the standardization and automation of your inspection processes!
Not only can we detect minute defects (foreign substances, scratches, etc.) that occur on transparent substrates such as sapphire, which have traditionally been difficult to inspect, but we can also automate and standardize the inspection process that has previously shown significant variability when done by the naked eye.
- Company：大日商事
- Price：Other
